App note: Using ESD diodes as voltage clamps

App note from Analog Devices on improving robustness of an amplifier by determining and mitigating internal ESD diode clamp electrical overestress. Link here When external overvoltage conditions are applied to an amplifier, ESD diodes are the last line of defense between your amplifier and electrical over stress. With proper understanding of how an ESD cell […]

App note: Design considerations for a harsh industrial environment

This article discusses factors that influence the robustness of a circuit in a harsh environment, like you would find for industrial applications. The topics covered include ways to handle voltage transients and to protect against electrostatic discharge (ESD) and faults. Link here Semiconductor (IC) robustness—what is the operating temperature range? How is high electrical noise handled? […]

App note: Analyzing VIN overstress in power ICs

Investigative app note from Richtek about the component failure point caused by EOS. Link here (PDF) Failures in power ICs are often the result of Electrical Over Stress (EOS) on the IC input supply pin. This report explains the structure of power IC input ESD protection and how ESD cells can become damaged due to […]

App note: Trends in integrated circuits that affect ESD protection requirements

A quick lookup on the ESD protection evolution of ICs in this app note from ON Semiconductor. Link here (PDF) The stunning progress in integrated circuit capability over the last 40 years is most succinctly expressed by Moore’s Law; “Every 2 years the number of transistors that can be economically manufactured in an integrated circuit […]

App note: SD(HC)-memory card and MMC interface conditioning

An ESD and EMI protection app note(PDF) from NXP for SD and MMC memory interfaces. This document gives an overview about different ESD protection and EMI filter devices optimized for SD-memory card and MMC interfaces. These devices cover the range from 1-bit to current standard 4-bit (SD-memory card, SD 2.0) or 8-bit (MMC) high-speed memory […]

App note: EMI and ESD filtering of audio interconnects

App note(PDF) on NUF2441FC EMI and ESD filter chip from ON Semiconductor. The continued ever-increasing integration of more functions into personal electronic devices such as cell phones has made electronics manufacturers demand more integrated functions to reduce part count and save board space. Cell phone manufacturers have also driven component manufacturers to produce more efficient […]

App note: ESD and EMC sensitivity of IC

A good beginner app note (PDF) from NXP on protecting ICs from ESD. Integrated circuits are sensitive to electrostatic discharge (a sudden and short-time flow of currents) and electromagnetic fields (at which they can be source or victim of both of it). This application note shall be understood as an introductive basic description of what […]

App note: Damage from a lightning bolt or a spark—It depends on how tall you are!

Here’s an application note from Maxim describing how to protect printed circuit boards (PCBs) against ESD destruction: Large steel buildings, automobiles, mountains, even people survive real atmospheric lightning. Humans can also create their own miniature lightning bolts (sparks) and survive. When those sparks reach an IC, however, major trouble results. In this tutorial, we will discuss […]

TI EMI/ESD protection guide

Electrostatic discharge (ESD) isn’t something you usually think about until after you’ve accidentally zapped a sensitive component and can’t figure out why it looks OK but isn’t working. Similarly, electromagnetic interference (EMI) usually isn’t taken into account unless it begins to negatively impact a new wireless design. TI has released a 41-page PDF entitled System […]

App note: Improving USB system reliability with transient suppressors

Adding transient suppressors to USB devices [PDF!] can help prevent damage from static discharge. This is important because USB devices are handled without protection, carried in pockets, tossed in bags, etc. Because frequent human interaction with the USB system occurs as a result of its attractive hot-plugging ability, there is the possibility for large ESD […]