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App note: Simple test method for estimating the stability of linear regulators

Posted on Sunday, March 24th, 2019 in app notes by DP

an_rohm_linear_reg_stability_test

Tips from ROHM Semiconductor to estimate the stability of linear regulator using simple step response method. Link here (PDF)

Low drop-out (LDO) regulators developed back in the age when large-capacitance multi-layer ceramic capacitors (hereinafter, MLCCs) were uncommon cause a phase delay, leading to oscillation when connected to a low-ESR capacitor like an MLCC. Often, MLCCs are used to save board space and prolong the lives of electronic components. A resistor placed in series in the circuit increases apparent ESR and establishes a phase lead that enable the use of an MLCC as an output capacitor. Phase margin measurement is practical on an LDO having variable output voltage, since its feedback loop is outwardly exposed. However, on a fixed output voltage LDO, the phase margin cannot be measured because of its closed loop circuit.

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