Categories

DeepSec 2011: intelligent Bluetooth fuzzing – why bother?

Posted on Thursday, September 13th, 2012 in digital radio data, RF, talks, wireless by the machinegeek

Security researchers Tommi Mäkilä and Jukka Taimisto of Codenomicon gave this presentation at the DeepSec 2011 conference discussing ways to sensibly test Bluetooth stacks. Their talk presents the number of ways in which Bluetooth attacks have been attempted with varying degrees of success. They also present a discussion on fuzzing techniques and creating intelligent fuzzers for Bluetooth systems, making their case for why building intelligent fuzzers is basically a waste of time, since all the test targets will fail even with the less intelligent test suites.

This entry was posted on Thursday, September 13th, 2012 at 3:00 pm and is filed under digital radio data, RF, talks, wireless. You can follow any responses to this entry through the RSS 2.0 feed. You can skip to the end and leave a response. Pinging is currently not allowed.

Leave a Reply

Notify me of followup comments via e-mail. You can also subscribe without commenting.

Recent Comments

  • Pekka Akselin: This is ridiculous!? :-) We are back at 256(!) byte EPROMs that needed multiple, a handful, of voltages to run! :-(
  • KH: Let's try a back-of-envelope calc balancing energies. From MCP1700 datasheet, there are graphs for a 200mA load step. Estimate the energy shortfall as 12uJ. Say...
  • Daniel: It's been a week and my comment is still awaiting moderation. Apparently the CIA doesn't want their involvement known?
  • KH: Agree, so okay, I guess he must have learned from somewhere. 100nF and 1000uF is so far apart, that was jarring; it's more magic incantation...
  • Max: I have a suspicion the hefty electrolytic cap might be some sort of cargo cult carry-over from other RF-based projects - for instance, I've seen...